Wafer tracking, recipe control, and yield intelligence for semiconductor fabs
Track every wafer through the fab, map every defect, version and approve every recipe, and catch process drift before it costs yield — without buying nine separate modules.
The problem
Fabs track wafers in spreadsheets, defect maps in standalone tools, and recipe versions by memory. Odoo has no wafer genealogy, no substrate/defect coordinate model, no recipe version control tied to equipment, and no statistical process control. Correlating a defect cluster to a recipe change to an equipment state requires manual, error-prone cross-referencing across disconnected systems.
The solution
One integrated Odoo app tracks every wafer and die through the process, renders defect maps spatially, versions and approves recipes with a full audit trail, deploys them with load confirmation, runs SPC control charts and capability indices, and ties equipment state to downtime and OEE — all cross-linked in a single connected view.
Everything a fab needs, in one app
Every capability below is implemented in the module.
Wafer Genealogy & Disposition
Track every wafer and daughter die through the full process with a chronological status-history timeline. Automatic scrap-disposition triggers when defects exceed a configurable threshold, plus good-die integration with Odoo Inventory.
Visual Defect & Substrate Maps
2D grid geometry for any substrate format with cartesian and polar coordinate addressing. Import inspection results via KLARF-lite, then see defects rendered spatially on an interactive wafer-map widget with severity and classification.
Recipe Version Control
Branch, clone, and roll back recipe versions with a full lifecycle state machine from draft to archived. Golden-recipe lock-down prevents unauthorized changes, and every parameter change carries a mandatory engineering justification.
Multi-Level Approval & Sign-Off
Process engineer and manufacturing manager approval stages with electronic sign-off before a recipe goes active. Comments and annotations travel with every parameter change so the why is never lost.
Deployment With Load Confirmation
Deploy a recipe version to equipment with an explicit compatibility check, then confirm it actually loaded on the tool. If equipment rejects a version, retry or fall back to the previous recipe.
SPC Charts & Capability Indices
X-bar and Range control charts calculated from grouped measurement subsamples, with configurable-sigma UCL/LCL and Cp, Cpk, Pp, and Ppk capability indices on every chart.
Nelson's 8-Rule Alerting
Automated out-of-control detection against Nelson's eight rules, with configurable severity and in-app or email delivery so process drift reaches the right person before it becomes scrap.
Equipment Health & TPM
SEMI E32 equipment-state logging maps automatically to planned or unplanned downtime categories. OEE availability, MTTR/MTBF trending, and a rolling health score are computed from the state stream, with maintenance requests raised automatically.
Lightweight Feed-Forward APC
Feed-forward formulas compute recipe parameters from upstream metrology, with run-to-run offset compensation for tool-wear correction — and an in-product prerequisite notice so teams know what must already be tuned.
How it works
Author & version a recipe
Create a recipe, branch a new version, and edit parameters with mandatory engineering justification and comments.
Approve and lock
Route the version through engineer and manager sign-off, then lock it golden so it cannot be changed unexpectedly.
Deploy and confirm
Send the version to equipment after a compatibility check, and confirm the load — with retry or fallback if it is rejected.
Track yield and control
Wafers move through the process while SPC charts, defect maps, and equipment state feed a connected yield and root-cause view.
Frequently asked
No sales fog. If your question isn't here, email us and we'll answer it the same way.
No. Version 1 ingests data via standard files (KLARF inspection results, recipe formats) and a defined ingestion interface rather than live equipment drivers. If your fab already has SECS/GEM connectivity, you can feed data in through the same file-based interface.
Buy it on the Odoo App Store
Purchase, download and install directly from the official Odoo Apps Store — you'll always get the latest supported build.
Semiconductor Fab Wafer & Recipe Management
Wafer genealogy, visual defect maps, recipe version control with multi-level sign-off, SPC charts with Nelson-rule alerting and equipment TPM — connected so defects trace back to recipes and tools.
Buy on Odoo App Store